Abstract

Three powder standard specimens (Si, Y2O3 and LiF) were studied with the recently acquired Fatec-SP´s Rigaku MiniFlex II Desktop X-ray Diffratometer. The patterns were obtained with a copper tube in step by step mode (0.05 °2θ) counting at least three seconds per step (equivalent speed of 1 °2θ/minute.)
Pawley and Rietveld refinements were performed with the help of Accelrys Materials Studio 5.0. The final statistics indicators for Rietveld (expressed in %) Rwp, Rwp w/o background and Rp (9.0, 12.2 and 7.2 for Si; 3.0, 2.0, and 6.5 for Y2O3; 4.0, 5.2 and 2.9 for LiF) did indicate excellent agreements between experimental and calculated profiles.